DocumentCode
843213
Title
Semianalytical method for calculating the impedance variation of an arbitrary eddy-current probe
Author
Juillard, Jerome ; Pichenot, Gregoire ; Masia, Antoine
Author_Institution
Dept. of Meas., SUPELEC, Gif-sur-Yvette, France
Volume
38
Issue
5
fYear
2002
fDate
9/1/2002 12:00:00 AM
Firstpage
3448
Lastpage
3453
Abstract
We present an explicit analytical solution to the problem of a point current source in a half-space or a plate. Under the hypothesis of a first-order Born approximation, the expression of the vector potential above the plate can then be used to calculate impedance variations due to a flaw in a number of configurations. We demonstrate the method and validate it on a simple case
Keywords
Green´s function methods; eddy current testing; eddy currents; electric impedance; flaw detection; arbitrary eddy-current probe; eddy-current testing; explicit analytical solution; first-order Born approximation; flaw; half-space; impedance variation; plate; point current source; semianalytical Green function-based method; semianalytical method; vector potential; Approximation methods; Equations; Geometry; Impedance; Implants; Personal communication networks; Probes; Scattering; Solid modeling; Testing;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2002.802712
Filename
1041961
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