Title :
Unexpected effect of field angle in magnetoresistance measurements of high-purity Nb
Author :
Goodrich, L.F. ; Stauffer, T.C. ; Splett, J.D. ; Vecchia, D.F.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
6/1/2005 12:00:00 AM
Abstract :
We report on unexpected field-angle dependence of magnetoresistance measurements of commercial, high-purity Nb discovered during our study of residual resistivity ratio (RRR) measurements. The RRR value indicates the purity and the low-temperature thermal conductivity of the Nb and is used as a specification for superconducting radio-frequency cavities. The RRR is typically defined as the ratio of the electrical resistivities measured at 273 K and 4.2 K. One way to obtain the normal-state resistivity at 4.2 K is to measure the resistivity versus magnetic field at 4.2 K and extrapolate to zero field. The field-angle dependence was measured when a specimen was rotated while the field was transverse to the specimen current. The resistance changed by about 10% as the angle varied at 8 T and the local maxima and minima of the resistance were separated by about 30°. This was observed on three polycrystalline Nb bar specimens with nominal dimensions of 64 mm × 6.7 mm × 3.3 mm and voltage taps separated by 30 mm. A similar field-angle dependence was obtained on a polycrystalline Cu wire specimen. This phenomenon has implications for Nb RRR measurements and interlaboratory comparisons.
Keywords :
accelerator RF systems; accelerator cavities; magnetoresistance; niobium; thermal conductivity measurement; Nb; field angle; low-temperature thermal conductivity; magnetoresistance measurements; residual resistivity ratio measurements; superconducting radio-frequency cavities; Current measurement; Electric resistance; Electric variables measurement; Electrical resistance measurement; Goniometers; Magnetic field measurement; Magnetoresistance; Niobium; Radio frequency; Thermal conductivity; Angular dependence; niobium; residual resistivity ratio; resistance measurement; superconductor;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.849373