Title :
An analytical threshold voltage and subthreshold current model for short-channel MESFETs
Author :
De, Vivek K. ; Meindl, James D.
Author_Institution :
Center for Integrated Electron., Rensselaer Polytech. Inst., Troy, NY, USA
fDate :
2/1/1993 12:00:00 AM
Abstract :
Short-channel effects on the subthreshold behavior are modeled in self-aligned gate MESFETs with undoped substrates through an analytical solution of the two-dimensional Poisson equation in the subthreshold region. Based on the resultant potential solution, simple and accurate analytical expressions for short-channel threshold voltage, subthreshold swing, and subthreshold drain current are derived. These are then used to develop an expression for minimum acceptable channel length. A comparative study of the short-channel effects in MESFETs with doped and undoped substrates indicates that channel lengths will be limited to 0.15-0.2 μm by subthreshold conduction. Besides offering insight into the device physics of the short-channel effects in MESFETs, the model provides a useful basis for accurate analysis and simulation of small-geometry GaAs MESFET digital circuits
Keywords :
Schottky gate field effect transistors; semiconductor device models; 0.15 to 0.2 micron; GaAs; MESFETs; doped substrate; drain current; self-aligned gate; short-channel effects; subthreshold current; threshold voltage; two-dimensional Poisson equation; undoped substrates; Analytical models; Circuit simulation; Digital circuits; Gallium arsenide; Integrated circuit modeling; MESFET circuits; Poisson equations; Substrates; Subthreshold current; Threshold voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of