DocumentCode
843515
Title
Secondary Ion Mass Spectrometry at Close to Single-Atom Concentration Using DC Accelerators
Author
Purser, K.H. ; Litherland, A.E. ; Rucklidge, J.C.
Author_Institution
General Ionex Corporation, Newburyport, Massachusetts, USA
Volume
26
Issue
1
fYear
1979
Firstpage
1338
Lastpage
1346
Keywords
Acceleration; Atomic measurements; Detectors; Electromagnetic analysis; Geologic measurements; Geology; Interference; Ion accelerators; Mass spectroscopy; Particle accelerators;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1979.4330383
Filename
4330383
Link To Document