High-yield assembly of multichip modules through known-good IC´s and effective test strategies

Multichip module technology has been shown to offer significant improvements for electronics equipment in the areas of miniaturized size, reduced weight, capability for higher frequency operation, improved thermal performance, and improved reliability. Production applications for multichip modules (MCMs) have grown from high-end computer and aerospace modules to include such diverse products as telecommunications, automotive, and consumer electronics modules. One of the keys to economic success in all applications is the achievement of high manufacturing yields. Yield losses must be kept very low compared with module costs in order to remain economically competitive. Two parameters with a very strong impact on manufacturing yield, known-good components entering assembly and test strategies at various levels of assembly, are discussed. Current industry practice is surveyed and recent progress on MCM infrastructure development is summarized