• DocumentCode
    843540
  • Title

    Heavy-Ion-Induced X-Ray Spectrometry for Chemical Analysis

  • Author

    Watson, R.L. ; Demarest, J.A. ; Langenberg, A. ; Jenson, F.E. ; White, J.R. ; Bahr, C.C.

  • Author_Institution
    Cyclotron Institute and Department of Chemistry, Texas A&M University, College Station, Texas 77843
  • Volume
    26
  • Issue
    1
  • fYear
    1979
  • Firstpage
    1352
  • Lastpage
    1357
  • Abstract
    High resolution x-ray spectrometry in combination with excitation by heavy-ion bombardment provides a number of prospective ways of obtaining information relating to the chemical state of a substance. The relative intensity distribution of the K¿ x-ray satellites arising from multiply ionized atoms is sensitive to the chemical environment and in some cases might be profitably employed to distinguish between various chemical species. At resolutions sufficient to discern features of the multiplet structure associated with the angular momentum coupling of unpaired electrons, it is found that the multiplet intensities are also sensitive to the environment and are therefore capable of providing additional chemical information. For elements below phosphorous in the periodic table, the K¿ satellites overlap the K absorption edge, thereby providing a convenient and accurate means of measuring K binding energies. In this way, chemical shifts equivalent to those obtained by ESCA may be determined.
  • Keywords
    Chemical analysis; Chemical elements; Chemistry; Cyclotrons; Electromagnetic wave absorption; Electrons; Energy measurement; Filling; Satellites; Spectroscopy;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1979.4330385
  • Filename
    4330385