Title :
Measurement-based method for characterizing the intensity and phase modulation properties of SOA-MZI wavelength converters
Author :
Cao, S.-C. ; Cartledge, J.C.
Author_Institution :
Commun. Res. Centre, Ottawa, Ont., Canada
Abstract :
A novel model is described for an integrated all-active semiconductor optical amplified Mach Zehnder interferometric (SOA-MZI) wavelength converter that is based on the static dependence of the power- and /spl alpha/-parameter for the wavelength-converted signal on the input power, the intensity modulation frequency response, and the phase modulation frequency response. This provides a consistent procedure for the device characterization and modeling in which both the intensity and phase of the wavelength-converted signal are directly related to the intensity of the input signal. Good agreement is demonstrated between calculated and measured results for the time-resolved chirp and intensity.
Keywords :
Mach-Zehnder interferometers; integrated optics; intensity modulation; optical communication equipment; optical modulation; optical wavelength conversion; phase modulation; semiconductor device models; semiconductor optical amplifiers; wavelength division multiplexing; SOA-MZI wavelength converters; all-active SOA-MZI wavelength converter; device characterization; input power; input signal intensity; integrated all-active semiconductor optical amplified Mach Zehnder interferometric wavelength converter; intensity modulation; intensity modulation frequency response; measurement-based method; phase modulation; phase modulation frequency response; static dependence; time-resolved chirp; time-resolved intensity; wavelength converted signal; wavelength-converted signal; Frequency response; Integrated optics; Intensity modulation; Optical interferometry; Optical modulation; Optical wavelength conversion; Phase measurement; Phase modulation; Stimulated emission; Wavelength measurement;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2002.803912
