• DocumentCode
    844169
  • Title

    Pruning the Volterra Series for Behavioral Modeling of Power Amplifiers Using Physical Knowledge

  • Author

    Zhu, Anding ; Pedro, JoséCarlos ; Cunha, Telmo Reis

  • Author_Institution
    Sch. of Electr., Electron. & Mech. Eng., Univ. Coll. Dublin
  • Volume
    55
  • Issue
    5
  • fYear
    2007
  • fDate
    5/1/2007 12:00:00 AM
  • Firstpage
    813
  • Lastpage
    821
  • Abstract
    This paper presents an efficient and effective approach to pruning the Volterra series for behavioral modeling of RF and microwave power amplifiers. Rather than adopting a pure "black-box" approach, this model pruning technique is derived from a physically meaningful block model, which has a clear linkage to the underlying physical behavior of the device. This allows all essential physical properties of the PA to be retained, but significantly reduces model complexity by removing unnecessary coefficients from the general Volterra series. A reduced-order model of this kind can be easily extracted from standard time/frequency-domain measurements or simulations, and may be simply implemented in system-level simulators. A complete physical analysis and a systematic derivation are presented, together with both computer simulations and experimental validations
  • Keywords
    Volterra series; circuit simulation; frequency-domain analysis; microwave power amplifiers; time-domain analysis; Volterra series; frequency-domain measurements; microwave power amplifiers; model pruning; power amplifiers behavioral modeling; radiofrequency power amplifier; reduced-order model; system-level simulators; time-domain measurements; Computational modeling; Couplings; Measurement standards; Microwave amplifiers; Microwave devices; Power amplifiers; Power system modeling; Radio frequency; Radiofrequency amplifiers; Reduced order systems; Behavioral model; Volterra series; power amplifiers (PAs);
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2007.895155
  • Filename
    4195689