• DocumentCode
    844309
  • Title

    Direct magnetic patterning of nonferromagnetic Co-C thin films by electron-beam radiation

  • Author

    Zhou, T.J. ; Zhao, Y. ; Wang, J.P. ; Chong, T.C. ; Thong, J.T.L.

  • Author_Institution
    Data Storage Inst., Singapore, Singapore
  • Volume
    38
  • Issue
    5
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    1970
  • Lastpage
    1972
  • Abstract
    Non-ferromagnetic Co-C thin films were magnetically patterned by electron-beam direct writing. Co50C50 films with thickness of 30-60 nm were prepared by alternately sputtering Co and C films onto C-buffered glass substrates. The as-deposited Co50C50 films are amorphous and nonferromagnetic. Magnetic patterning of the as-deposited Co50C50 film was realized by subjecting it to electron-beam radiation using a focused 30 keV beam with a current of 6.6 nA and a dwell time per dot of 3.8 s and longer. The smallest magnetic dot diameter produced by a dwell time per dot of 3.8 s is about 270 nm. The magnetic dot diameter increases linearly with the square root of dwell time per dot, which implies that the magnetic dots are produced by heat-conduction-induced phase change in the film. The magnetic measurements show that the dots are magnetically soft. The present nanolithography is potentially a flexible alternative to fabricate patterned magnetic nanostructures for submicrometer magnetic devices.
  • Keywords
    atomic force microscopy; cobalt alloys; electron beam effects; electron beam lithography; ferromagnetic materials; magnetic force microscopy; magnetic recording; magnetic thin films; magnetic transitions; nanotechnology; soft magnetic materials; sputtered coatings; superparamagnetism; 270 nm; 3.8 s; 30 keV; 30 to 60 nm; 6.6 nA; AFM images; C-buffered glass substrates; Co50C50; MFM images; alternate sputtering; amorphous nonferromagnetic film; direct magnetic patterning; dwell time per dot; electron-beam direct writing; focused electron beam; heat-conduction-induced phase change; magnetic dot diameter; magnetically soft dots; nanolithography; nonferromagnetic Co-C thin films; patterned magnetic nanostructures; submicrometer magnetic devices; superparamagnetism; Amorphous magnetic materials; Amorphous materials; Glass; Magnetic devices; Magnetic films; Magnetic variables measurement; Soft magnetic materials; Sputtering; Substrates; Writing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2002.802785
  • Filename
    1042061