DocumentCode :
844309
Title :
Direct magnetic patterning of nonferromagnetic Co-C thin films by electron-beam radiation
Author :
Zhou, T.J. ; Zhao, Y. ; Wang, J.P. ; Chong, T.C. ; Thong, J.T.L.
Author_Institution :
Data Storage Inst., Singapore, Singapore
Volume :
38
Issue :
5
fYear :
2002
fDate :
9/1/2002 12:00:00 AM
Firstpage :
1970
Lastpage :
1972
Abstract :
Non-ferromagnetic Co-C thin films were magnetically patterned by electron-beam direct writing. Co50C50 films with thickness of 30-60 nm were prepared by alternately sputtering Co and C films onto C-buffered glass substrates. The as-deposited Co50C50 films are amorphous and nonferromagnetic. Magnetic patterning of the as-deposited Co50C50 film was realized by subjecting it to electron-beam radiation using a focused 30 keV beam with a current of 6.6 nA and a dwell time per dot of 3.8 s and longer. The smallest magnetic dot diameter produced by a dwell time per dot of 3.8 s is about 270 nm. The magnetic dot diameter increases linearly with the square root of dwell time per dot, which implies that the magnetic dots are produced by heat-conduction-induced phase change in the film. The magnetic measurements show that the dots are magnetically soft. The present nanolithography is potentially a flexible alternative to fabricate patterned magnetic nanostructures for submicrometer magnetic devices.
Keywords :
atomic force microscopy; cobalt alloys; electron beam effects; electron beam lithography; ferromagnetic materials; magnetic force microscopy; magnetic recording; magnetic thin films; magnetic transitions; nanotechnology; soft magnetic materials; sputtered coatings; superparamagnetism; 270 nm; 3.8 s; 30 keV; 30 to 60 nm; 6.6 nA; AFM images; C-buffered glass substrates; Co50C50; MFM images; alternate sputtering; amorphous nonferromagnetic film; direct magnetic patterning; dwell time per dot; electron-beam direct writing; focused electron beam; heat-conduction-induced phase change; magnetic dot diameter; magnetically soft dots; nanolithography; nonferromagnetic Co-C thin films; patterned magnetic nanostructures; submicrometer magnetic devices; superparamagnetism; Amorphous magnetic materials; Amorphous materials; Glass; Magnetic devices; Magnetic films; Magnetic variables measurement; Soft magnetic materials; Sputtering; Substrates; Writing;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2002.802785
Filename :
1042061
Link To Document :
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