DocumentCode
844669
Title
The Surface Sensitivity of MeV Ion Scattering
Author
Ignatiev, A. ; Bøgh, E.
Author_Institution
Institute of Physics, Aarhus University, 8000 Aarhus C, Denmark and Department of Physics, University of Houston, Houston, Texas 77004
Volume
26
Issue
1
fYear
1979
Firstpage
1824
Lastpage
1826
Abstract
400 keV helium ions have been scattered in the single channeling mode from a Ni(001) surface covered with an adsorbed ordered overlayer of tellurium. The atomic surface structure of the Ni(001)-C(2 x 2)-Te system was checked by low-energy electron-diffraction (LEED) and confirmed to be that reported earlier. The channeling results however, have not at this point in time yielded atomic surface structure information which can unambiguously confirm or deny the LEED results.
Keywords
Atomic layer deposition; Atomic measurements; Energy resolution; Helium; Nickel; Physics; Scattering; Surface cleaning; Surface structures; Tellurium;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1979.4330494
Filename
4330494
Link To Document