• DocumentCode
    844976
  • Title

    Solid-state refrigeration for cooling microprocessors

  • Author

    Ramanathan, S. ; Chrysler, G.M.

  • Author_Institution
    Components Res. Dept., Intel Corp., Hillsboro, USA
  • Volume
    29
  • Issue
    1
  • fYear
    2006
  • fDate
    3/1/2006 12:00:00 AM
  • Firstpage
    179
  • Lastpage
    183
  • Abstract
    Thin-film thermoelectrics (TECs) are potential candidates for cooling microprocessors due to their large cooling power density and ability to integrate with packages. In addition, there are no moving parts or noise generated during their operation. In particular, thin-film TECs offer the ability to cool localized regions of high heat flux (hot spots) in the die selectively, which is very useful for chips with nonuniform power maps. In this paper, we theoretically analyze the performance of thin-film TECs for reducing the junction temperature at hot spots in a die. We report the reduction in junction temperature for a representative power map as a function of input power to the TEC films for the first time. The potential benefits and limitations of scaling the TEC legs are calculated by solving the general TEC equations within a fully three-dimensional numerical model of the assembled die and package. Parasitic electrical contact resistance and back conduction from the hot-side to cold-side through any encapsulating or material surrounding TEC legs are also included in the model. Model calculations are performed for TEC figure of merit (ZT) values of 1 and 3 (for comparison). We determine an operating envelope for the TECs that leads to an optimum cooling capability. The impact of operating the TECs are calculated as well taking into account the temperature increase of the heat spreader due to heat influx from the hot-side of the TEC. It is shown that material breakthroughs as well as process improvements could enable solid-state refrigeration to be an attractive candidate for spot cooling in microprocessors.
  • Keywords
    assembling; contact resistance; cooling; encapsulation; microprocessor chips; refrigeration; thermal management (packaging); thermoelectricity; thin films; heat flux; heat influx; heat spreader; junction temperature; large cooling power density; microprocessor cooling; model calculations; parasitic electrical contact resistance; reduction injunction temperature; solid-state refrigeration; thin-film thermoelectrics; Cooling; Leg; Microprocessors; Noise generators; Packaging; Refrigeration; Solid state circuits; Temperature; Thermoelectricity; Transistors; Figure of merit (ZT) values; thin-film thermoelectrics (TECs);
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2006.870392
  • Filename
    1599508