DocumentCode
845037
Title
Corrosion studies of copper and aluminum interconnects exposed to automotive oils
Author
Ishii, T. ; Tsuyuno, N. ; Sato, T. ; Masuda, M.
Author_Institution
Hitachi Res. Lab., Hitachi Ltd., Ibaraki, Japan
Volume
29
Issue
1
fYear
2006
fDate
3/1/2006 12:00:00 AM
Firstpage
213
Lastpage
221
Abstract
Applications in the automotive field present some of the harshest environments for electrical components, especially for plastic packaging devices. Encapsulation technology by epoxy molding compounds is widely used for integrated circuit and large-scale integration packaging. It is not a hermetic sealing method, but it provides small sized and very low cost packaging. When used for on-engine or in-transmission modules, long-term reliability becomes a concern. This paper examines the reliability of epoxy encapsulated electronic devices in harsh environments, such as in high temperature automotive oil and oil vapor environments. The focus is on wiring corrosion in electronic devices, taking into account these mounted in an automatic transmission of a car. Corrosive substances from high temperature oil and corrosion behavior of metals are analyzed. A novel test method is introduced, which can evaluate the corrosive level under various durability conditions.
Keywords
aluminium; automotive electronics; copper; corrosion; encapsulation; integrated circuit interconnections; integrated circuit reliability; materials testing; aluminum interconnects; automatic transmission fluids; automotive oil; copper interconnects; durability condition; electronic packaging; epoxy encapsulated electronic device; epoxy molding compounds; oil vapor; wiring corrosion; Aluminum; Automotive engineering; Copper; Corrosion; Electronics packaging; Integrated circuit packaging; Integrated circuit reliability; Oils; Petroleum; Temperature; Automatic transmission fluids (ATFs); automotive; corrosion; electronic packaging; epoxy molding compounds (EMC); reliability;
fLanguage
English
Journal_Title
Components and Packaging Technologies, IEEE Transactions on
Publisher
ieee
ISSN
1521-3331
Type
jour
DOI
10.1109/TCAPT.2006.870391
Filename
1599513
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