DocumentCode
845317
Title
New realization of the ohm and farad using the NBS calculable capacitor
Author
Shields, John Q. ; Dziuba, Ronald F. ; Layer, Howard P.
Author_Institution
NBS, Gaithersburg, MD, USA
Volume
38
Issue
2
fYear
1989
fDate
4/1/1989 12:00:00 AM
Firstpage
249
Lastpage
251
Abstract
Results of a realization of the ohm and farad using the US National Bureau of Standards (NBS) calculable capacitor and associated apparatus are reported. The results show that both the NBS representation of the ohm and the NBS representation of the farad are changing with time, ΩNBS at the rate of -0.054 p.p.m./year and F NBS at the rate of 0.010 p.p.m./year. The realization of the ohm is of particular significance because of its role in assigning an SI value to the quantized Hall resistance. The estimated uncertainty of the ohm realization is 0.022 p.p.m. (1σ), while the estimated uncertainty of the farad realization is 0.014 p.p.m. (1σ)
Keywords
capacitance measurement; capacitors; electric resistance measurement; quantum Hall effect; units (measurement); NBS calculable capacitor; SI value; US National Bureau of Standards; capacitance measurement; electric resistance measurement; farad; ohm; quantized Hall resistance; Bridge circuits; Capacitance; Capacitors; Electric resistance; Electrical resistance measurement; Frequency measurement; Laboratories; NIST; Resistors; Uncertainty;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.192281
Filename
192281
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