• DocumentCode
    845317
  • Title

    New realization of the ohm and farad using the NBS calculable capacitor

  • Author

    Shields, John Q. ; Dziuba, Ronald F. ; Layer, Howard P.

  • Author_Institution
    NBS, Gaithersburg, MD, USA
  • Volume
    38
  • Issue
    2
  • fYear
    1989
  • fDate
    4/1/1989 12:00:00 AM
  • Firstpage
    249
  • Lastpage
    251
  • Abstract
    Results of a realization of the ohm and farad using the US National Bureau of Standards (NBS) calculable capacitor and associated apparatus are reported. The results show that both the NBS representation of the ohm and the NBS representation of the farad are changing with time, ΩNBS at the rate of -0.054 p.p.m./year and FNBS at the rate of 0.010 p.p.m./year. The realization of the ohm is of particular significance because of its role in assigning an SI value to the quantized Hall resistance. The estimated uncertainty of the ohm realization is 0.022 p.p.m. (1σ), while the estimated uncertainty of the farad realization is 0.014 p.p.m. (1σ)
  • Keywords
    capacitance measurement; capacitors; electric resistance measurement; quantum Hall effect; units (measurement); NBS calculable capacitor; SI value; US National Bureau of Standards; capacitance measurement; electric resistance measurement; farad; ohm; quantized Hall resistance; Bridge circuits; Capacitance; Capacitors; Electric resistance; Electrical resistance measurement; Frequency measurement; Laboratories; NIST; Resistors; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.192281
  • Filename
    192281