• DocumentCode
    84534
  • Title

    Redshift in Absorption Edge of Cd _{bm{{1-x}}} Co _{bm{{x}}} S Nanofilms

  • Author

    Kumar, Sudhakar ; Sharma, Parmanand ; Sharma, Vishal

  • Author_Institution
    Dept. of Phys. & Mater. Sci., Jaypee Univ. of Inf. Technol., Solan, India
  • Volume
    13
  • Issue
    2
  • fYear
    2014
  • fDate
    Mar-14
  • Firstpage
    343
  • Lastpage
    348
  • Abstract
    Cd1-xCoxS nanofilms (0 ≤ x ≤ 0.08) deposited by chemical bath deposition have been studied using energy dispersive X-ray spectroscopy, Fourier transform infrared spectroscopy, scanning electron microscopy, and ultraviolet-visible-near-infrared spectroscopy. A redshift in Cd-S stretch with Co doping has been observed. The incorporation of Co2+ ions in CdS lattice deteriorates the large crystallites with an increase in grain boundaries. A redshift in absorption edge has also been observed with Co concentration. This shift may be explained on the basis of band tailing due to creation of defect states. The optical behavior of Cd1-xCoxS nanofilms has been analyzed in term of Tauc model, Urbach-Martienssen model, and Vegard´s law.
  • Keywords
    Fourier transform spectra; II-VI semiconductors; X-ray chemical analysis; cadmium compounds; cobalt compounds; crystallites; defect states; grain boundaries; infrared spectra; liquid phase deposition; nanostructured materials; red shift; semiconductor doping; semiconductor growth; semiconductor thin films; ultraviolet spectra; visible spectra; wide band gap semiconductors; Cd1-xCoxS; Fourier transform infrared spectroscopy; Tauc model; Urbach-Martienssen model; Vegard law; absorption edge; band tailing; chemical bath deposition; crystallites; defect states; doping; energy dispersive X-ray spectroscopy; grain boundaries; nanofilms; optical behavior; redshift; scanning electron microscopy; ultraviolet-visible-near-infrared spectroscopy; Absorption; Ions; Lattices; Optical films; Particle beam optics; Photonic band gap; Fourier transform infrared spectroscopy (FTIR); nanofilm; scanning electron microscope (SEM); ultraviolet-visible-near-infrared spectroscopy (UV-visible-NIR);
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2014.2303200
  • Filename
    6729137