Title :
Estimation and control of power electronic device temperature during operation with variable conducting current
Author :
Musallam, M. ; Acarnley, P.P. ; Johnson, C.M. ; Pritchard, L. ; Pickert, V.
Author_Institution :
Sch. of Electr. & Electron. Eng., Univ. of Nottingham
fDate :
4/1/2007 12:00:00 AM
Abstract :
Frequent variations in device power loss cause corresponding changes in operating temperature, which may adversely affect device reliability. A method for reducing the device temperature variations is introduced. A simplified third-order thermal model of the device is evaluated in real-time to estimate the instantaneous device temperature. The estimated temperature is used in a temperature control loop to reduce temperature variations by adjusting the device switching frequency. In this way, changes in device conduction loss are counteracted by varying the switching losses, so that the overall losses are substantially constant. The principle is applied to a MOSFET switching a dc load current at random intervals
Keywords :
field effect transistor switches; power MOSFET; semiconductor device models; temperature control; thermal management (packaging); DC load current; MOSFET; conduction loss; instantaneous device temperature estimation; power electronic device temperature; switching frequency; switching losses; temperature control loop; temperature variations reduction; third-order thermal model; variable conducting current;
Journal_Title :
Circuits, Devices & Systems, IET
DOI :
10.1049/iet-cds:20060066
