DocumentCode :
84559
Title :
Leveraging Process Variation for Performance and Energy: In the Perspective of Overclocking
Author :
Hyung Beom Jang ; Junhee Lee ; Joonho Kong ; Taeweon Suh ; Sung Woo Chung
Author_Institution :
Dept. of Comput. & Radio Commun. Eng., Korea Univ., Seoul, South Korea
Volume :
63
Issue :
5
fYear :
2014
fDate :
May-14
Firstpage :
1316
Lastpage :
1322
Abstract :
Process variation is one of the most important factors to be considered in recent microprocessor design, since it negatively affects performance, power, and yield of microprocessors. However, by leveraging process variation, overclocking techniques can improve performance. As microprocessors have substantial clock cycle time margin for yield, there is enough room for performance improvement by overclocking techniques. In this paper, we adopt the F-overclocking technique, which increases clock frequency without changing supply voltage. Our experimental results show that the F-overclocking technique significantly improves performance as well as energy consumption. In addition, the F-overclocking technique is superior to the conventional overclocking technique which increases clock frequency and supply voltage together in the perspective of energy efficiency and reliability, showing similar performance improvement. Furthermore, we propose an adaptive overclocking controller which dynamically applies the F-overclocking technique based on the application characteristics. By adopting our adaptive overclocking controller, we further minimize the reliability loss caused by the F-overclocking technique.
Keywords :
adaptive control; energy conservation; microprocessor chips; power aware computing; power consumption; F-overclocking technique; adaptive overclocking controller; clock frequency; energy consumption; energy efficiency; leveraging process variation; microprocessor design; performance improvement; reliability; substantial clock cycle time margin; supply voltage; Clocks; Delay; Energy consumption; Low voltage; Microprocessors; Power demand; Reliability; Overclocking; energy efficiency; performance; process variation; reliability;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.2012.286
Filename :
6374616
Link To Document :
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