Wide-band measurement of the complex permittivity of dielectric materials using a wide-band cavity

Author

Saed, Mohammad A. ; Riad, Sedki M. ; Elshabini-Riad, Aicha

Author_Institution

Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA

Volume

38

Issue

2

fYear

1989

fDate

4/1/1989 12:00:00 AM

Firstpage

488

Lastpage

495

Abstract

A technique is presented for the characterization of dielectric materials over a wide band of frequencies (RF to millimeter wave region). The cavity structure offers a well-defined reference plane for precision measurements of dielectric characteristics. The dielectric sample completely fills a cylindrical cavity adapted to a precision air line(s). Two configurations are considered: the terminating cavity configuration, in which the cavity is adapted to the end of a precision air line; and the through-cavity configuration where the cavity is placed between two precision air lines. The measured scattering parameters, the reflection and/or the transmission coefficients, are used to determine the complex permittivity of the dielectric sample

Keywords

cavity resonators; computerised instrumentation; dielectric materials; digital simulation; electronic engineering computing; permittivity measurement; cavity structure; complex permittivity; cylindrical cavity; dielectric characteristics; dielectric materials; reference plane; reflection coefficients; scattering parameters; terminating cavity configuration; through-cavity configuration; transmission coefficients; wide-band cavity; wideband measurement; Conducting materials; Conductors; Dielectric materials; Dielectric measurements; Dielectric substrates; Frequency measurement; Permittivity measurement; Reflection; Thick films; Wideband;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.192333

Filename

192333