DocumentCode
846064
Title
A test system for automated characterization of performance relevant storage media defects
Author
Berger, Rüdiger ; Hampel, Matthias ; Krause, Frank ; Fleischmann, Friedrich ; Dietzel, Andreas
Author_Institution
Anal. Lab. & New Projects, IBM Deutschland Speichersysteme GmbH, Mainz, Germany
Volume
38
Issue
5
fYear
2002
fDate
9/1/2002 12:00:00 AM
Firstpage
2435
Lastpage
2437
Abstract
Defects in magnetic hard disk media reduce the performance of hard disk drives. A consequence of the increasing storage density is that submicrometer defects in the magnetic storage media become more relevant. However, finding and visual inspection of these defects under an optical microscope is problematic. Therefore, a spin test stand technique was used to reliably map the performance of relevant storage media defect positions, and a computer controlled technique was developed which positions those defects relative to a local analysis tool within 45 s. The accuracy and repeatability was measured to be ±0.05° in angular (approximately ±30 μm of a circular arc) and ±5 μm in radial direction, respectively. Here, surface analysis of defects has been performed using scanning force microscopy. Defect and disk features with heights < 1 nm have been measured routinely while defect diameters were in the range of 1 μm to 250 nm. In particular, nontopographic defects are visualized by means of magnetic force microscopy.
Keywords
atomic force microscopy; automatic test equipment; hard discs; magnetic force microscopy; angular direction; automated characterization; clean-room compatible characterization tool; computer controlled technique; coordinate system transformation; defect positioning; hard disk drives; magnetic force microscopy; magnetic hard disk media; performance relevant storage media defects; radial direction; scanning force microscopy; spin test stand technique; submicrometer defects; surface analysis of defects; topographic properties; Automatic optical inspection; Automatic testing; Hard disks; Magnetic analysis; Magnetic memory; Optical microscopy; Performance analysis; Storage automation; System testing; Visualization;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2002.803605
Filename
1042212
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