• DocumentCode
    846064
  • Title

    A test system for automated characterization of performance relevant storage media defects

  • Author

    Berger, Rüdiger ; Hampel, Matthias ; Krause, Frank ; Fleischmann, Friedrich ; Dietzel, Andreas

  • Author_Institution
    Anal. Lab. & New Projects, IBM Deutschland Speichersysteme GmbH, Mainz, Germany
  • Volume
    38
  • Issue
    5
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    2435
  • Lastpage
    2437
  • Abstract
    Defects in magnetic hard disk media reduce the performance of hard disk drives. A consequence of the increasing storage density is that submicrometer defects in the magnetic storage media become more relevant. However, finding and visual inspection of these defects under an optical microscope is problematic. Therefore, a spin test stand technique was used to reliably map the performance of relevant storage media defect positions, and a computer controlled technique was developed which positions those defects relative to a local analysis tool within 45 s. The accuracy and repeatability was measured to be ±0.05° in angular (approximately ±30 μm of a circular arc) and ±5 μm in radial direction, respectively. Here, surface analysis of defects has been performed using scanning force microscopy. Defect and disk features with heights < 1 nm have been measured routinely while defect diameters were in the range of 1 μm to 250 nm. In particular, nontopographic defects are visualized by means of magnetic force microscopy.
  • Keywords
    atomic force microscopy; automatic test equipment; hard discs; magnetic force microscopy; angular direction; automated characterization; clean-room compatible characterization tool; computer controlled technique; coordinate system transformation; defect positioning; hard disk drives; magnetic force microscopy; magnetic hard disk media; performance relevant storage media defects; radial direction; scanning force microscopy; spin test stand technique; submicrometer defects; surface analysis of defects; topographic properties; Automatic optical inspection; Automatic testing; Hard disks; Magnetic analysis; Magnetic memory; Optical microscopy; Performance analysis; Storage automation; System testing; Visualization;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2002.803605
  • Filename
    1042212