DocumentCode :
846098
Title :
A very wide-band frequency response measurement system using optical heterodyne detection
Author :
Kawanishi, Satoki ; Saruwatari, Masatoshi
Author_Institution :
NTT Labs., Kanagawa, Japan
Volume :
38
Issue :
2
fYear :
1989
fDate :
4/1/1989 12:00:00 AM
Firstpage :
569
Lastpage :
573
Abstract :
A very-wide band frequency response measurement system for optical devices has been established using the optical heterodyne detection method utilizing two distributed feedback-laser diodes (DFB-LDs). By controlling the laser diode (LD) temperature, the beat frequency is swept from DC to beyond several tens of gigahertz and the measurable bandwidth can be extended to that frequency without any additional calibration. In this system, the spectral linewidth of each LD is stabilized by the two-stage optical isolator and the lightwaves are mixed with the same polarization by a polarization-maintaining optical coupler. The optical frequency fluctuation of the LD is detected by the change of the transmitted optical power through Fabry-Perot etalon and the frequency is controlled by the negative feedback to the LD temperature. Included are a comparison of measurement methods, features of the developed measurement system, and the measurement results
Keywords :
demodulation; distributed feedback lasers; frequency measurement; light interferometry; light polarisation; measurement by laser beam; optical communication equipment; optical variables measurement; Fabry-Perot etalon; beat frequency; distributed feedback-laser diodes; light polarisation; negative feedback; optical communication equipment; optical frequency fluctuation; optical heterodyne detection; optical receiver; spectral linewidth; two-stage optical isolator; wide-band frequency response measurement; Frequency measurement; Frequency response; Optical control; Optical detectors; Optical devices; Optical feedback; Optical mixing; Optical polarization; Temperature control; Wideband;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.192349
Filename :
192349
Link To Document :
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