DocumentCode
846205
Title
Cross-tie walls in thin permalloy films
Author
Redjdal, M. ; Kakay, A. ; Ruane, M.F. ; Humphrey, F.B.
Author_Institution
Dept. of Electr. & Comput. Eng., Boston Univ., MA, USA
Volume
38
Issue
5
fYear
2002
fDate
9/1/2002 12:00:00 AM
Firstpage
2471
Lastpage
2473
Abstract
Cross-tie walls in permalloy films have been simulated as a function of thickness in the range 10-70 nm using direct integration of the Landau-Lifshitz-Gilbert equation in a Cartesian lattice with periodic boundary conditions along the length of the wall. A cross-tie wall is a Bloch-like transition along the wall [or vertical Bloch line (VBL)] between Neel Walls of opposite chirality in a film with in-plane magnetization. This transition is a low-energy state, which allows the long tails of Neel walls to partially close their magnetic flux in the vicinity of the walls. The magnetization configuration of these transitions is either elliptical (vortex) or hyperbolic (antivortex). The pi-VBL transitions are 50 nm in diameter and the distance from each other increases with film thickness. The cross-tie wall energy per unit area was lower than that of a pure Neel or Bloch wall between 15 and 50 nm film thickness.
Keywords
Permalloy; ferromagnetic materials; integration; magnetic domain walls; magnetic thin films; 10 to 70 nm; Bloch-like transition; Cartesian lattice; Landau-Lifshitz-Gilbert equation; antivortex; asymmetric Bloch wall; cross-tie wall energy per unit area; cross-tie walls; direct integration; in-plane magnetization; long Neel wall tails; low-energy state; magnetization configuration; opposite chirality Neel walls; partial magnetic flux closure; periodic boundary conditions; pi-VBL transitions; symmetric Bloch wall; thickness dependence; thin permalloy films; vertical Bloch line; vortex; Boundary conditions; Equations; Lattices; Magnetic films; Magnetic flux; Magnetic force microscopy; Magnetization; Micromagnetics; Probability distribution; Solid state circuits;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2002.803617
Filename
1042224
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