• DocumentCode
    846217
  • Title

    Numerical simulation of remagnetization processes in extended thin films and periodic nanodot arrays

  • Author

    Berkov, Dmitri V. ; Gorn, Natalia L.

  • Author_Institution
    INNOVENT e.V., Jena, Germany
  • Volume
    38
  • Issue
    5
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    2474
  • Lastpage
    2476
  • Abstract
    The best approach to compute the long-range stray field by micromagnetic simulations of systems with periodic boundary conditions (PBCs) on regular grids is the fast Fourier transform (FFT)-based solution of the Poisson equation combined with the Ewald method to ensure a rapid convergence of the Fourier series. Here, we present the version of such an FFT-Ewald method suitable for grids of rectangular cells. Further, we have incorporated the evaluation of the near-field part of the Ewald sums into the FFT procedure used to evaluate the field of the Gaussian dipole lattice, so that no additional time is spent for the near-field computation. The method described can be used for simulation of any three- or two-dimensional systems with PBC. We present physical examples dealing with extended thin films and arrays of nanowires and nanodots.
  • Keywords
    Poisson equation; arrays; boundary-value problems; fast Fourier transforms; interface magnetism; magnetic thin films; magnetisation; nanotechnology; numerical analysis; periodic structures; Ewald method; Fourier series rapid convergence; Gaussian dipole lattice field; Poisson equation; extended thin films; fast Fourier transform based solution; long-range stray field; micromagnetic simulations; nanowire arrays; numerical simulation; periodic boundary conditions; periodic nanodot arrays; rectangular cell grids; remagnetization processes; Boundary conditions; Computational modeling; Fast Fourier transforms; Fourier series; Grid computing; Lattices; Micromagnetics; Numerical simulation; Poisson equations; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2002.803618
  • Filename
    1042225