DocumentCode :
846469
Title :
Ultra-low-power DLMS adaptive filter for hearing aid applications
Author :
Kim, Chris Hyung-il ; Soeleman, Hendrawan ; Roy, Kaushik
Author_Institution :
Electr. & Comput. Eng. Dept., Purdue Univ., West Lafayette, IN, USA
Volume :
11
Issue :
6
fYear :
2003
Firstpage :
1058
Lastpage :
1067
Abstract :
We present an ultra-low-power, delayed least mean square (DLMS) adaptive filter operating in the subthreshold region for hearing aid applications. Subthreshold operation was accomplished by using a parallel architecture with pseudo nMOS logic style. The parallel architecture enabled us to operate the system at a lower clock rate and reduced supply voltage while maintaining the same throughput. Pseudo nMOS logic operating in the subthreshold region (subpseudo nMOS) provided better power-delay product than subthreshold CMOS (sub-CMOS) logic. Simulation results show that the DLMS adaptive filter can operate at 22 kHz using a 400-mV supply voltage to achieve 91% improvement in power compared to a nonparallel, CMOS implementation. To validate the robust operation of subthreshold logics, a 0.35 /spl mu/m, 23.1 kHz, 21.4 nW, 8/spl times/8 carry save array multiplier test chip was fabricated where an adaptive body biasing scheme is used for compensating process, supply and temperature variations. The test chip showed stable operation at a supply voltage of 0.30 V, which is even lower than the threshold voltages of the pMOS (0.82 V) and nMOS (0.67 V) transistors.
Keywords :
CMOS logic circuits; adaptive filters; clocks; delay filters; hearing aids; logic gates; power filters; 0.30 V; 0.35 micron; 0.67 V; 0.82 V; 21.4 nW; 22 kHz; 23.1 kHz; 400 mV; adaptive body biasing scheme; array multiplier test chip; delayed least mean square adaptive filter operation; hearing aid applications; lower clock rate; power-delay product; pseudo nMOS logic style; robust operation; subpseudo nMOS; subthreshold CMOS logic; ultra-low-power DLMS adaptive filter; Adaptive filters; Auditory system; CMOS logic circuits; Clocks; Delay; Logic arrays; Logic testing; MOS devices; Parallel architectures; Threshold voltage;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2003.819573
Filename :
1255480
Link To Document :
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