Title :
Electrodeposited Co-Pt permanent micromagnet arrays on Cu[111]-Si[110] substrates
Author :
Zana, Iulica ; Zangari, Giovanni
Author_Institution :
Dept. of Metall. & Mater. Eng., Alabama Univ., Tuscaloosa, AL, USA
fDate :
9/1/2002 12:00:00 AM
Abstract :
Co-Pt cylindrical micromagnets with 2-μm diameter have been successfully fabricated by electroplating through resist masks onto Cu[111] seed layers. The influence of the applied current density and cylinder height on the magnetic properties have been investigated. Both coercivity and retentivity increase with increasing aspect ratio, due to the combined effect of the decreasing demagnetizing field and the increasing perpendicular crystalline anisotropy of Co-Pt, which grows preferentially with HCP(0001) orientation. Values as high as 4.3 kOe for the coercivity and 6.9 kG for retentivity have been observed. Large energy products up to 5.38 MGOe (42.83 kJ/m3) were attained, rendering these structures potential candidates for hard magnetic components in microelectromechanical systems.
Keywords :
cobalt alloys; coercive force; current density; demagnetisation; electroplated coatings; ferromagnetic materials; magnetic thin films; microactuators; permanent magnets; perpendicular magnetic anisotropy; platinum alloys; remanence; 2 micron; 6.9 kG; Co-Pt; Co-Pt cylindrical micromagnets; Cu-Si; Cu[111] seed layers; Cu[111]-Si[110] substrates; HCP(0001) orientation; applied current density; aspect ratio; coercivity; cylinder height; demagnetizing field; electrodeposited Co-Pt permanent micromagnet arrays; electroplating; hard magnetic components; large energy products; magnetic microactuators; magnetic properties; microelectromechanical systems; perpendicular crystalline anisotropy; resist masks; retentivity; Anisotropic magnetoresistance; Coercive force; Crystallization; Current density; Demagnetization; Magnetic anisotropy; Magnetic properties; Microelectromechanical systems; Perpendicular magnetic anisotropy; Resists;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.801928