• DocumentCode
    846781
  • Title

    Detecting and locating electrical shorts using group testing

  • Author

    Chen, C. ; Hwang, F.K.

  • Author_Institution
    AT&T Bell Lab., Piscataway, NJ, USA
  • Volume
    36
  • Issue
    8
  • fYear
    1989
  • fDate
    8/1/1989 12:00:00 AM
  • Firstpage
    1113
  • Lastpage
    1116
  • Abstract
    Consideration is given to the problem of detecting and locating electrical shorts among a set of nets using an apparatus which, when connected to two groups of nets, can detect, but not locate, the presence of a short between them. This problem was previously considered by J.K. Skilling and a clever method was patented by him (US Patent 4 342 959, Aug. 1982). The authors relate this short-locating problem to the well-studied group-testing problem and borrow some results from there to devise a procedure for the former. They show that the resulting procedure compares favorably with Skilling´s method. They also consider the case in which one of the two groups of nets being tested is restricted in size, as is true in many practical applications
  • Keywords
    circuit reliability; fault location; testing; Skilling´s method; electrical shorts; group testing; nets; size; Capacitors; Circuit faults; Circuit synthesis; Circuit testing; Frequency response; Impedance; Network synthesis; Operational amplifiers; Resistors; System testing;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/31.192423
  • Filename
    192423