Title :
Go/no-go testing of analogue macros
Author :
Al-Qutayri, M.A. ; Shepherd, P.R.
Author_Institution :
Sch. of Electron. & Electr. Eng., Bath Univ., UK
fDate :
8/1/1992 12:00:00 AM
Abstract :
A time-domain go/no-go testing strategy for analogue integrated circuit macros is presented. The strategy is based on exciting an analogue macro with a pseudo-random binary sequence and measuring the transient response generated at the external nodes, thereby eliminating the need for intermediate probing. Four methods of analysing the transient response data are discussed. Of these methods, the response digitisation is the most efficient
Keywords :
analogue circuits; application specific integrated circuits; fault location; integrated circuit testing; linear integrated circuits; transient response; analogue integrated circuit; analogue macros; external nodes; fault model; go/no-go testing strategy; pseudo-random binary sequence; response digitisation; time-domain; transient response;
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings G
