DocumentCode
846844
Title
Go/no-go testing of analogue macros
Author
Al-Qutayri, M.A. ; Shepherd, P.R.
Author_Institution
Sch. of Electron. & Electr. Eng., Bath Univ., UK
Volume
139
Issue
4
fYear
1992
fDate
8/1/1992 12:00:00 AM
Firstpage
534
Lastpage
540
Abstract
A time-domain go/no-go testing strategy for analogue integrated circuit macros is presented. The strategy is based on exciting an analogue macro with a pseudo-random binary sequence and measuring the transient response generated at the external nodes, thereby eliminating the need for intermediate probing. Four methods of analysing the transient response data are discussed. Of these methods, the response digitisation is the most efficient
Keywords
analogue circuits; application specific integrated circuits; fault location; integrated circuit testing; linear integrated circuits; transient response; analogue integrated circuit; analogue macros; external nodes; fault model; go/no-go testing strategy; pseudo-random binary sequence; response digitisation; time-domain; transient response;
fLanguage
English
Journal_Title
Circuits, Devices and Systems, IEE Proceedings G
Publisher
iet
ISSN
0956-3768
Type
jour
Filename
160062
Link To Document