• DocumentCode
    846852
  • Title

    High temperature tests of ACSR conductor hardware

  • Author

    Jakubiak, E.A. ; Matrusz, J.S.

  • Author_Institution
    Detroit Edison Co., MI, USA
  • Volume
    4
  • Issue
    1
  • fYear
    1989
  • fDate
    1/1/1989 12:00:00 AM
  • Firstpage
    524
  • Lastpage
    531
  • Abstract
    Hardware temperature data obtained by laboratory tests of four common ACSR conductors are reported. A summary of the temperature data and linear equations and graphs relating conductor and hardware temperatures are included. Some conductor loss of strength data from laboratory tests are also reported. This study indicates that the line hardware can operate safely up to conductor temperatures of 200°C
  • Keywords
    conductors (electric); temperature measurement; 200 degC; ACSR conductors; high temperature tests; Aluminum; Capacitive sensors; Clamps; Conductors; Hardware; Laboratories; Shock absorbers; System testing; Temperature distribution; Thermal conductivity;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/61.19243
  • Filename
    19243