DocumentCode :
84695
Title :
GPUs Reliability Dependence on Degree of Parallelism
Author :
Rech, P. ; Nazar, G.L. ; Frost, Christopher ; Carro, Luigi
Author_Institution :
Inst. de Inf., Fed. Univ. of Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Volume :
61
Issue :
4
fYear :
2014
fDate :
Aug. 2014
Firstpage :
1755
Lastpage :
1762
Abstract :
A higher Degree of Parallelism decreases the code execution time. However, a higher scheduler strain is necessary to manage the increased number of parallel processes, which have the countermeasure of increasing the graphics processing unit (GPU) cross section. This hypothesis is confirmed by extensive neutron irradiation testing to study how the Degree of Parallelism affects GPU reliability. Moreover, the cache distribution forced by different Degrees of Parallelism is proved to influence the application error rate. Finally, the Mean Executions Between Failures metric is introduced to evaluate the amount of data computed correctly by the GPU on a practical application.
Keywords :
graphics processing units; reliability; GPU cross section; GPU reliability dependence; code execution time; graphics processing unit; parallelism degree; Complexity theory; Graphics processing units; Instruction sets; Neutrons; Parallel processing; Reliability; Sensitivity; Degree of Parallelism (DOP); graphics processing units (GPU); neutron sensitivity; reliability;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2014.2303855
Filename :
6800143
Link To Document :
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