• DocumentCode
    84695
  • Title

    GPUs Reliability Dependence on Degree of Parallelism

  • Author

    Rech, P. ; Nazar, G.L. ; Frost, Christopher ; Carro, Luigi

  • Author_Institution
    Inst. de Inf., Fed. Univ. of Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
  • Volume
    61
  • Issue
    4
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    1755
  • Lastpage
    1762
  • Abstract
    A higher Degree of Parallelism decreases the code execution time. However, a higher scheduler strain is necessary to manage the increased number of parallel processes, which have the countermeasure of increasing the graphics processing unit (GPU) cross section. This hypothesis is confirmed by extensive neutron irradiation testing to study how the Degree of Parallelism affects GPU reliability. Moreover, the cache distribution forced by different Degrees of Parallelism is proved to influence the application error rate. Finally, the Mean Executions Between Failures metric is introduced to evaluate the amount of data computed correctly by the GPU on a practical application.
  • Keywords
    graphics processing units; reliability; GPU cross section; GPU reliability dependence; code execution time; graphics processing unit; parallelism degree; Complexity theory; Graphics processing units; Instruction sets; Neutrons; Parallel processing; Reliability; Sensitivity; Degree of Parallelism (DOP); graphics processing units (GPU); neutron sensitivity; reliability;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2014.2303855
  • Filename
    6800143