Title :
Model Order Reduction for Multiband Quantum Transport Simulations and its Application to p-Type Junctionless Transistors
Author :
Huang, Joshua Zhexue ; Chew, W.C. ; Jie Peng ; Chi-Yung Yam ; Li Jun Jiang ; Guan-Hua Chen
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
Abstract :
An efficient method is developed for multiband simulation of quantum transport in nanowire electronic devices within nonequilibrium Green´s function formalism. The efficiency relies on a model order reduction technique, which projects the k · p Hamiltonian into a much smaller subspace constructed by sampling the Bloch modes of each cross-section layer. Several sampling approaches are discussed to obtain a minimum and accurate basis with reduced computational overhead. The technique is verified by calculating the valence bands of silicon nanowires (SiNWs) and by solving I-V curves of p-type SiNW transistors. This enables us to study for the first time the performances of large cross-section p-type junctionless (JL) transistors in the quantum ballistic transport limit. The influences of doping density, transport direction, channel length, and cross-section size are examined. We find that larger doping densities may lead to worse sub-threshold slopes due to the enhanced source-to-drain tunneling. Compared with their counterparts, i.e., classical inversion-mode (IM) transistors, they have better sub-threshold behaviors, but they do not necessarily provide a better ON/OFF ratio except when the channel is short or thin. In addition, unlike IM transistors, [110] and [111] channel directions in JL transistors are very robust against channel thicknes scaling.
Keywords :
Green\´s function methods; elemental semiconductors; field effect transistors; nanowires; sampling methods; semiconductor device models; silicon; Bloch modes; I-V curves; IM transistors; JL transistors; Si; channel length; channel thicknes scaling; cross-section layer; cross-section size; doping density; enhanced source-to-drain tunneling; inversion-mode transistors; k·p Hamiltonian; large cross-section p-type junctionless transistors; model order reduction technique; multiband quantum transport simulations; nanowire electronic devices; nonequilibrium Green\´s function formalism; p-type SiNW transistors; quantum ballistic transport limit; sampling approach; silicon nanowires; subthreshold slopes; transport direction; valence bands; ${kcdot p}$ approach; Junctionless transistors; model order reduction (MOR); multiband simulation; nonequilibrium Green\´s function (NEGF); quantum transport; silicon nanowire transistors;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2013.2260546