Title :
Long-Term Destructive SEE Risk and Calculations Using Multiple “Worst-Case” Events Versus Modelling
Author :
Jiggens, Piers ; Evans, Hugh ; Truscott, Pete ; Heynderickx, Daniel ; Fan Lei ; DeDonder, Erwin
Author_Institution :
Space Environ. & Effects Sect., Eur. Space Res. & Technol. Centre (ESTEC), Noordwijk, Netherlands
Abstract :
A statistical analysis comparing the number of CREME-96 worst-week environments to a space environment particle flux data analysis and the PSYCHIC model is presented. This analysis provides an indication of the number of worst-week environments that are required to obtain a particular confidence level and determine the associated risk of a destructive single event effect over a mission but highlights the drawback of such an approach compared to using a statistical model. A method for direct assessment of the number of Single Event Effects expected specific to components and shielding geometries using the European Space Agency SEPEM system is also presented.
Keywords :
aerospace instrumentation; radiation effects; risk analysis; solar cosmic ray particles; statistical analysis; CREME-96 worst week environments; European Space Agency; PSYCHIC model; SEPEM system; destructive single event effect; long term destructive SEE risk; multiple worst-case events; shielding geometry; single event effects; space environment particle flux data analysis; statistical analysis; Analytical models; Data models; Geometry; Ionization; Protons; Space vehicles; Time series analysis; Single Event Effect (SEE); Solar Particle Event (SPE); statistical modelling;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2014.2302994