Title :
Wafer probe transducer efficiency
Author :
Williams, Dylan F. ; Marks, Roger B. ; Walker, David K. ; Clague, Fred R.
Author_Institution :
Nat. Inst. of Stand & Technol., Boulder, CO, USA
Abstract :
Experimental evidence is presented that shows the conventional expression relating the transducer efficiency of a two-port to measured scattering parameters is incorrect when the characteristic impedance at one of the ports is complex. This evidence is based on the measurement of the power from a microwave source transferred through a probe to a lossy coplanar waveguide. The conventional expression differs from the measurement by up to 20%. An alternative, accounting for the complex characteristic impedance, gives accurate results.<>
Keywords :
S-parameters; electric impedance; integrated circuit testing; measurement theory; microwave measurement; power measurement; probes; test equipment; transducers; complex characteristic impedance; lossy coplanar waveguide; microwave source; scattering parameters; transducer efficiency; two-port; wafer probe; Coplanar waveguides; Impedance measurement; Microwave measurements; NIST; Power measurement; Probes; Reflection; Scattering parameters; Thermistors; Transducers;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
