Title :
Interface magnetic properties of epitaxial Fe-InAs heterostructures
Author :
Xu, Y.B. ; Tselepi, M. ; Wu, J. ; Wang, S. ; Bland, J.A.C. ; Huttel, Y. ; van der Laan, G.
Author_Institution :
Dept. of Electron., Fudan Univ., Shanghai, China
fDate :
9/1/2002 12:00:00 AM
Abstract :
The growth and interface magnetic properties of epitaxial Fe films grown on InAs [100]-4×2 have been studied using low-energy electron diffraction, in situ magneto-optical Kerr effect, and X-ray magnetic circular dichroism. The magnetic properties at room temperature were found to proceed via three phases with thickness; a nonmagnetic phase, a superparamagnetic phase, and a ferromagnetic phase. The initial ferromagnetic phase might be stabilized by interparticle interactions. The films show bulk-like spin moments of 1.90 ± 0.15 μB with the thickness above about 20 ML and a large enhancement ∼ 260% of the ratio of orbital versus spin moment in the ultrathin region.
Keywords :
III-V semiconductors; Kerr magneto-optical effect; ferromagnetic materials; indium compounds; interface magnetism; iron; low energy electron diffraction; magnetic circular dichroism; magnetic epitaxial layers; magnetic moments; narrow band gap semiconductors; semiconductor-metal boundaries; superparamagnetism; Fe-InAs; InAs[100] substrate; X-ray magnetic circular dichroism; epitaxial Fe ultrathin film; ferromagnetic metal/semiconductor heterostructure; ferromagnetic phase; growth; interface magnetic properties; low energy electron diffraction; magneto-optical Kerr effect; nonmagnetic phase; orbital moment; spin electronics; spin moment; superparamagnetic phase; Electrons; Iron; Kerr effect; Laboratories; Magnetic films; Magnetic properties; Magnetooptic effects; Plasma temperature; Substrates; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.801981
