Highly accurate quasi-static modeling of microstrip lines over lossy substrates

Author

Tuncer, Ernre ; Neikirk, Dean P.

Author_Institution

Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA

Volume

2

Issue

10

fYear

1992

Firstpage

409

Lastpage

411

Abstract

A highly accurate quasi-static model of a microstrip over a semiconductor layer has been developed. The model agrees with full-wave calculations in all three modes of propagation (skin-effect, slow-wave, and dielectric quasi-TEM), for both the attenuation constant alpha and the propagation constant beta over a very wide range of dimension, substrate conductivity, and frequency. To achieve this level of agreement, a nonuniform cross-section, transverse resonance technique has been applied to find the series impedance per unit length of the microstrip transmission line.<>

Keywords

skin effect; strip lines; waveguide theory; attenuation constant; dielectric quasi-TEM; lossy substrates; microstrip lines; nonuniform cross-section; propagation constant; quasi-static modeling; quasistatic model; semiconductor layer; series impedance; skin-effect; slow-wave; transverse resonance technique; Capacitance; Conductivity; Dielectric losses; Dielectric substrates; Frequency; Inductance; Magnetic fields; Microstrip; Semiconductivity; Transmission lines;

fLanguage

English

Journal_Title

Microwave and Guided Wave Letters, IEEE

Publisher

ieee

ISSN

1051-8207

Type

jour

DOI

10.1109/75.160123

Filename

160123