• DocumentCode
    847882
  • Title

    Fabrication and characterization of Fe81Ga19 thin films

  • Author

    Weston, J.L. ; Butera, A. ; Lograsso, T. ; Shamsuzzoha, M. ; Zana, I. ; Zangari, G. ; Barnard, J.

  • Author_Institution
    MINT Center, Alabama Univ., Tuscaloosa, AL, USA
  • Volume
    38
  • Issue
    5
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    2832
  • Lastpage
    2834
  • Abstract
    In order to incorporate magnetostrictive actuators into microelectromechanical systems devices, thin film magnetoelastic materials must have both a high magnetostriction and a low saturation field. This work focuses on the fabrication and characterization of [110] oriented epitaxial FeGa thin films grown epitaxially on Cu on Si. The material in the bulk exhibits a large magnetostriction and in thin film form is here shown to be easily saturated in all in-plane orientations in fields under 500 Oe. Thin (less than 160 nm) FeGa films grow according to a single [110] variant on Cu[100]/Si[100]. On the contrary, thick (160 nm) films exhibit multiple [110] variants.
  • Keywords
    ferromagnetic materials; gallium alloys; iron alloys; magnetic anisotropy; magnetic epitaxial layers; magnetoelastic effects; magnetostriction; magnetostrictive devices; microactuators; sputter deposition; vapour phase epitaxial growth; 160 nm; Cu-Si; Cu[100]/Si[100]; Fe81Ga19; Fe81Ga19 thin films; [110] oriented epitaxial FeGa thin films; characterization; fabrication; high magnetostriction; in-plane orientations; large magnetostriction; low saturation field; magnetic anisotropy; magnetostrictive actuators; microelectromechanical systems devices; multiple [110] variants; single [110] variant; thick films; thin film magnetoelastic materials; Actuators; Fabrication; Iron; Magnetic devices; Magnetic materials; Magnetostriction; Magnetostrictive devices; Microelectromechanical systems; Saturation magnetization; Semiconductor thin films;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2002.802468
  • Filename
    1042376