DocumentCode
847910
Title
Investigation of hydrogen-sensing properties of Pd/AlGaAs-based Schottky diodes
Author
Tsai, Yan-Ying ; Lin, Kun-Wei ; Lu, Chun-Tsen ; Chen, Huey-Ing ; Chuang, Hung-Ming ; Chen, Chun-Yuan ; Cheng, Chin-Chuan ; Liu, Wen-Chau
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume
50
Issue
12
fYear
2003
Firstpage
2532
Lastpage
2539
Abstract
The hydrogen response characteristics and sensing properties or catalytic Pd/Al0.3Ga0.7As metal-oxide-semiconductor (MOS) and metal-semiconductor (MS) Schottky diodes are systematically studied. The effects of hydrogen adsorption on device performances such as the current-voltage characteristics, sensitivity, barrier height variation, heat of adsorption, and transient response are investigated. The studied devices can be operated under very wide hydrogen concentration regimes with remarkable hydrogen-sensing properties. Particularly, at an extremely low hydrogen concentration of 15 ppm H2/air, both steady-state and transient responses at room temperature can be detected. In addition, under the presence of oxide layer in the studied MOS device, a larger change of barrier height and higher hydrogen response are observed. In addition, according to the van´t Hoff equation, the initial values of heat adsorption for Pd/semiconductor and Pd/oxide interface are calculated as 7.29 and 49.6 KJ/mole, respectively.
Keywords
Fermi level; III-V semiconductors; Schottky diodes; aluminium compounds; catalysts; gallium arsenide; gas sensors; heat of adsorption; hydrogen; palladium; transient response; AES depth profiles; Fermi-level pinning; H; Pd; Pd-AlGaAs; Schottky diodes; barrier height variation; catalytic MOS diodes; catalytic metal-semiconductor diodes; current-voltage characteristics; device sensitivity; gas sensor; heat of adsorption; hydrogen adsorption; hydrogen-sensing properties; transient response; Current-voltage characteristics; Fabrication; Gallium arsenide; Hydrogen; Photonic band gap; Schottky diodes; Semiconductor materials; Steady-state; Temperature; Transient response;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2003.819656
Filename
1255619
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