Title :
Study on Ag-Plated Cu Lead Frame and Its Effect to LED Performance Under Thermal Aging
Author :
Lei Zhang ; Yejun Zhu ; Wei Wang ; Xianghong Bi ; Haibin Chen ; Leung, Kwong-Sak ; Yeqing Wu ; Jingshen Wu
Author_Institution :
Dept. of Mech. & Aerosp. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
Abstract :
A systematic study about the effect of thermal aging time on lead frame morphology and LED optical performance was demonstrated in this paper. Three different lead frames for LED manufacturing were chosen to execute thermal aging test for reliability qualification. An evolution about Ag recrystallization, Cu diffusion, Cu nucleation, and growth on lead frame surface was comprehensively explained. The relationship between surface morphology and lead frame reflectance was first established by experimental characterization and comparison. After that, theoretical analysis based on diffusion theory reasonably explained the copper diffusion and nucleation process, which matches well with the morphology changes. Later on, optical simulation on various commercial LED packages was implemented to evaluate the effect of lead frame reflectance on the optical output. In conclusion, centering on Cu diffusion induces reflectance decrease, the connection initializes from thermal aging to final LED lumen performance was successfully built up in this paper. The findings can be directly applied as guidance to facilitate industrial LED manufacturing and reliability qualification.
Keywords :
ageing; copper; diffusion; light emitting diodes; nucleation; recrystallisation; reflectivity; silver; surface morphology; Ag recrystallization; Ag-Cu; Ag-plated Cu lead frame; Cu diffusion; Cu nucleation; LED lumen performance; LED manufacturing; LED optical performance; lead frame morphology; lead frame reflectance; optical simulation; reliability qualification; surface morphology; thermal aging; Aging; Light emitting diodes; Morphology; Nickel; Optical reflection; Reflectivity; Surface morphology; Cu diffusion; Light emitting diodes; Nucleation and growth; Optical reflection; Reliability; light emitting diodes; nucleation and growth; optical reflection; reliability;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2014.2360081