Step-edge magnetoresistance of magnetite films

Author

Ziese, M. ; Höhne, R. ; Zimmer, K. ; Esquinazi, P.

Author_Institution

Dept. of Supercond. & Magnetism, Leipzig Univ., Germany

Volume

38

Issue

5

fYear

2002

fDate

9/1/2002 12:00:00 AM

Firstpage

2883

Lastpage

2885

Abstract

The magnetoresistance induced by step edges in magnetite films was investigated. The films were fabricated on MgAl₂O₄ substrates patterned by ion-beam etching prior to film deposition. If the crystallographic quality of the magnetite film is good enough, a clear magnetoresistance anisotropy is observed with respect to the relative direction of current and step edge.

Keywords

ferrimagnetic materials; iron compounds; magnetic thin films; magnetoresistance; pulsed laser deposition; tunnelling; Fe₃O₄; MgAl₂O₄; Verwey temperature; anisotropic magnetoresistance; crystallographic quality; current-voltage characteristics; extended defects; ferrimagnet; field-dependent magnetoresistance; ion-beam patterned substrates; magnetite films; magnetoresistance anisotropy; magnetotransport properties; pulsed-laser deposition; relative direction; step-edge magnetoresistance; tunneling; Etching; Grain boundaries; Iron; Magnetic anisotropy; Magnetoresistance; Perpendicular magnetic anisotropy; Substrates; Superconducting films; Superconducting magnets; Temperature;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2002.803166

Filename

1042398