DocumentCode :
848150
Title :
A new negative-resistance device
Author :
Geppert, D.V.
Volume :
51
Issue :
1
fYear :
1963
Firstpage :
223
Lastpage :
223
Keywords :
Capacitance measurement; Circuit testing; Current-voltage characteristics; Frequency; Niobium; Oscilloscopes; Probes; Semiconductor diodes; Strips; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1963.1689
Filename :
1443619
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=848150
