DocumentCode :
848169
Title :
Compound barriers in thin film TiO
2
diodes
Author :
Magill, P.J.
Volume :
51
Issue :
1
fYear :
1963
Firstpage :
223
Lastpage :
224
Keywords :
Capacitance measurement; Electrical resistance measurement; Niobium; Rectifiers; Schottky diodes; Semiconductor diodes; Testing; Titanium; Transistors; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1963.1690
Filename :
1443620
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=848169
