• DocumentCode
    848258
  • Title

    Influence of nonuniform basewidth on transistor failures

  • Author

    Kocsis, Menyhert

  • Volume
    51
  • Issue
    1
  • fYear
    1963
  • Firstpage
    229
  • Lastpage
    229
  • Keywords
    Alloying; Current density; Diodes; Equations; Feedback loop; Heating; Integrated circuit interconnections; Microscopy; Switching circuits; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1963.1699
  • Filename
    1443629
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=848258