DocumentCode :
848258
Title :
Influence of nonuniform basewidth on transistor failures
Author :
Kocsis, Menyhert
Volume :
51
Issue :
1
fYear :
1963
Firstpage :
229
Lastpage :
229
Keywords :
Alloying; Current density; Diodes; Equations; Feedback loop; Heating; Integrated circuit interconnections; Microscopy; Switching circuits; Temperature measurement;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1963.1699
Filename :
1443629
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=848258
