DocumentCode
848325
Title
Sm(Co,Fe,Cu,Zr)z magnets for high-temperature applications: microstructural and micromagnetic analysis
Author
Matthias, T. ; Scholz, W. ; Fidler, J. ; Schrefl, T. ; Rong, T.S. ; Jones, I.P. ; Harris, I.R.
Author_Institution
Inst. fur Festkorperphys., Wien Univ., Austria
Volume
38
Issue
5
fYear
2002
fDate
9/1/2002 12:00:00 AM
Firstpage
2943
Lastpage
2945
Abstract
The microstructure and the microchemistry of Sm(Co,Fe,Cu,Zr)z permanent magnets determine the domain wall pinning behavior. This work combines nanoanalytical investigations of the precipitation structure with micromagnetic simulations. A cellular precipitation structure, provides pinning centers. Measurements of the thickness of these precipitates by means of transmission electron microscopic image analysis and energy dispersive X-ray spectroscopy reveals that the average thickness is 15-18 nm, which is more than the calculated minimum value of 10 nm. Investigations of the elemental distribution across the precipitates show that the pinning behavior is repulsive.
Keywords
X-ray chemical analysis; cobalt alloys; copper alloys; ferromagnetic materials; high-temperature effects; iron alloys; magnetic domain walls; permanent magnets; precipitation; samarium alloys; transmission electron microscopy; zirconium alloys; Sm(Co,Fe,Cu,Zr)z permanent magnet; Sm(CoFeCuZr); cellular precipitation structure; domain wall pinning; elemental distribution; energy dispersive X-ray spectroscopy; high temperature applications; image analysis; microchemistry; micromagnetic simulation; microstructural nanoanalysis; transmission electron microscopy; Dispersion; Energy measurement; Image analysis; Micromagnetics; Microstructure; Permanent magnets; Spectroscopy; Thickness measurement; Transmission electron microscopy; X-ray imaging;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2002.803313
Filename
1042418
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