• DocumentCode
    848325
  • Title

    Sm(Co,Fe,Cu,Zr)z magnets for high-temperature applications: microstructural and micromagnetic analysis

  • Author

    Matthias, T. ; Scholz, W. ; Fidler, J. ; Schrefl, T. ; Rong, T.S. ; Jones, I.P. ; Harris, I.R.

  • Author_Institution
    Inst. fur Festkorperphys., Wien Univ., Austria
  • Volume
    38
  • Issue
    5
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    2943
  • Lastpage
    2945
  • Abstract
    The microstructure and the microchemistry of Sm(Co,Fe,Cu,Zr)z permanent magnets determine the domain wall pinning behavior. This work combines nanoanalytical investigations of the precipitation structure with micromagnetic simulations. A cellular precipitation structure, provides pinning centers. Measurements of the thickness of these precipitates by means of transmission electron microscopic image analysis and energy dispersive X-ray spectroscopy reveals that the average thickness is 15-18 nm, which is more than the calculated minimum value of 10 nm. Investigations of the elemental distribution across the precipitates show that the pinning behavior is repulsive.
  • Keywords
    X-ray chemical analysis; cobalt alloys; copper alloys; ferromagnetic materials; high-temperature effects; iron alloys; magnetic domain walls; permanent magnets; precipitation; samarium alloys; transmission electron microscopy; zirconium alloys; Sm(Co,Fe,Cu,Zr)z permanent magnet; Sm(CoFeCuZr); cellular precipitation structure; domain wall pinning; elemental distribution; energy dispersive X-ray spectroscopy; high temperature applications; image analysis; microchemistry; micromagnetic simulation; microstructural nanoanalysis; transmission electron microscopy; Dispersion; Energy measurement; Image analysis; Micromagnetics; Microstructure; Permanent magnets; Spectroscopy; Thickness measurement; Transmission electron microscopy; X-ray imaging;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2002.803313
  • Filename
    1042418