DocumentCode :
848325
Title :
Sm(Co,Fe,Cu,Zr)z magnets for high-temperature applications: microstructural and micromagnetic analysis
Author :
Matthias, T. ; Scholz, W. ; Fidler, J. ; Schrefl, T. ; Rong, T.S. ; Jones, I.P. ; Harris, I.R.
Author_Institution :
Inst. fur Festkorperphys., Wien Univ., Austria
Volume :
38
Issue :
5
fYear :
2002
fDate :
9/1/2002 12:00:00 AM
Firstpage :
2943
Lastpage :
2945
Abstract :
The microstructure and the microchemistry of Sm(Co,Fe,Cu,Zr)z permanent magnets determine the domain wall pinning behavior. This work combines nanoanalytical investigations of the precipitation structure with micromagnetic simulations. A cellular precipitation structure, provides pinning centers. Measurements of the thickness of these precipitates by means of transmission electron microscopic image analysis and energy dispersive X-ray spectroscopy reveals that the average thickness is 15-18 nm, which is more than the calculated minimum value of 10 nm. Investigations of the elemental distribution across the precipitates show that the pinning behavior is repulsive.
Keywords :
X-ray chemical analysis; cobalt alloys; copper alloys; ferromagnetic materials; high-temperature effects; iron alloys; magnetic domain walls; permanent magnets; precipitation; samarium alloys; transmission electron microscopy; zirconium alloys; Sm(Co,Fe,Cu,Zr)z permanent magnet; Sm(CoFeCuZr); cellular precipitation structure; domain wall pinning; elemental distribution; energy dispersive X-ray spectroscopy; high temperature applications; image analysis; microchemistry; micromagnetic simulation; microstructural nanoanalysis; transmission electron microscopy; Dispersion; Energy measurement; Image analysis; Micromagnetics; Microstructure; Permanent magnets; Spectroscopy; Thickness measurement; Transmission electron microscopy; X-ray imaging;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2002.803313
Filename :
1042418
Link To Document :
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