DocumentCode
848376
Title
Low ohmic contacts to C-doped p-GaAs with Au/Zn/Au structure
Author
Rezazadeh, Ali A. ; Rees, P.K.
Volume
28
Issue
13
fYear
1992
fDate
6/18/1992 12:00:00 AM
Firstpage
1248
Lastpage
1250
Abstract
The Au/Zn/Au metallisation scheme is investigated as a potential ohmic contact to C-doped p-type GaAs (4*1019 cm-3, 1000 AA). Two alloying techniques, thermal and RTA, were investigated for different alloying times. The alloying times were optimised for the best contact resistance and a specific contact resistance of 3.6*10-6 Omega cm2, corresponding to a transfer resistance of 0.04 Omega mm, was achieved using RTA at 400 degrees C for 60 s. These contacts showed ohmic behaviour prior to any heat treatment.
Keywords
III-V semiconductors; annealing; carbon; contact resistance; gallium arsenide; gold; heat treatment; metallisation; ohmic contacts; semiconductor-metal boundaries; zinc; 400 degC; 60 s; Au-Zn-Au-GaAs:C; Au/Zn/Au metallisation scheme; C-doped; C-doped p-type GaAs; RTA; alloying times; contact resistance; heat treatment; ohmic contacts; rapid thermal annealing; thermal alloying;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19920788
Filename
144364
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