DocumentCode :
848442
Title :
Memory switching effects in a-Si/c-Si heterojunction bipolar structures
Author :
Samuilov, V.A. ; Bondarionok, E.A. ; Shulman, D. ; Pulfrey, David L.
Author_Institution :
Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
Volume :
13
Issue :
8
fYear :
1992
Firstpage :
396
Lastpage :
398
Abstract :
The authors report a three-terminal undoped amorphous silicon (a-Si)/p-n crystalline silicon (c-Si) structure, which exhibits OFF and ON states. An OFF state is characterized by a current in the structure in the low nanoampere range due to the large resistance of the undoped a-Si layer, while in the ON state the structure exhibits a large conductance and its current is determined in practice by the load resistance. Reversible switching between the two states with a rise time of about 40 ns and a fall time of about 200 ns was achieved by applying appropriate positive or negative current pulses to the base of the c-Si p-n junction. The structure can be integrated into a standard bipolar process, and, being of a size suitable for VLSI applications, may be useful as a basic three-terminal memory cell.<>
Keywords :
amorphous semiconductors; elemental semiconductors; heterojunction bipolar transistors; semiconductor storage; semiconductor switches; silicon; 200 ns; 40 ns; OFF state; ON state; Si; VLSI; bipolar process; fall time; heterojunction bipolar structures; load resistance; memory switching effects; negative current pulses; positive current pulses; reversible switching; rise time; three-terminal memory cell; three-terminal structure; Amorphous silicon; Bonding; Crystallization; Heterojunctions; P-n junctions; Resistors; Senior members; Switches; Very large scale integration; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.192770
Filename :
192770
Link To Document :
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