DocumentCode
84848
Title
Stability Limit of a Semiconductor Laser With Optical Feedback
Author
Yuanlong Fan ; Yanguang Yu ; Jiangtao Xi ; Qinghua Guo
Author_Institution
Sch. of Electr., Comput. & Telecommun. Eng., Univ. of Wollongong, Wollongong, NSW, Australia
Volume
51
Issue
2
fYear
2015
fDate
Feb. 2015
Firstpage
1
Lastpage
9
Abstract
This paper presents comprehensive studies on the stability of a semiconductor laser (SL) with external optical feedback. In particular, based on numerical computation on the Lang and Kobayashi equations, the stability limit under the condition of minimum linewidth is investigated, revealing how it is influenced by three major parameters associated with SL operation conditions, including the feedback strength (k), the external cavity length (L), and the injection current (J). In contrast to existing work in literature, the presented removed all the approximations and assumptions, hence resulting in relatively complete description of the stability limit. This paper presented leads to a number of important and interesting discoveries: 1) the possible stable area is broader than what is described by the existing work; 2) for long external cavities, the stability limit can be described by a linear relationship between k and L; and 3) on the stability limit, the critical feedback strength (kc) and critical external cavity length (Lc) are discovered, respectively, being proportional and inversely proportional to J and k.
Keywords
laser cavity resonators; laser feedback; laser stability; semiconductor lasers; Kobayashi equations; Lang equations; critical external cavity length; critical feedback strength; external optical feedback; injection current; numerical computation; semiconductor laser; stability limit; Cavity resonators; Equations; Laser stability; Mathematical model; Numerical stability; Stability criteria; Semiconductor lasers; interferometry; optical feedback; optical feedback, interferometry; stability;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2014.2378780
Filename
6980057
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