• DocumentCode
    84848
  • Title

    Stability Limit of a Semiconductor Laser With Optical Feedback

  • Author

    Yuanlong Fan ; Yanguang Yu ; Jiangtao Xi ; Qinghua Guo

  • Author_Institution
    Sch. of Electr., Comput. & Telecommun. Eng., Univ. of Wollongong, Wollongong, NSW, Australia
  • Volume
    51
  • Issue
    2
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    This paper presents comprehensive studies on the stability of a semiconductor laser (SL) with external optical feedback. In particular, based on numerical computation on the Lang and Kobayashi equations, the stability limit under the condition of minimum linewidth is investigated, revealing how it is influenced by three major parameters associated with SL operation conditions, including the feedback strength (k), the external cavity length (L), and the injection current (J). In contrast to existing work in literature, the presented removed all the approximations and assumptions, hence resulting in relatively complete description of the stability limit. This paper presented leads to a number of important and interesting discoveries: 1) the possible stable area is broader than what is described by the existing work; 2) for long external cavities, the stability limit can be described by a linear relationship between k and L; and 3) on the stability limit, the critical feedback strength (kc) and critical external cavity length (Lc) are discovered, respectively, being proportional and inversely proportional to J and k.
  • Keywords
    laser cavity resonators; laser feedback; laser stability; semiconductor lasers; Kobayashi equations; Lang equations; critical external cavity length; critical feedback strength; external optical feedback; injection current; numerical computation; semiconductor laser; stability limit; Cavity resonators; Equations; Laser stability; Mathematical model; Numerical stability; Stability criteria; Semiconductor lasers; interferometry; optical feedback; optical feedback, interferometry; stability;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2014.2378780
  • Filename
    6980057