DocumentCode :
848483
Title :
Fault tests on embedded copper wire and copper tape shielded single conductor cables
Author :
Landinger, C. ; Cronin, L. Dennis
Author_Institution :
Anaconda Wire and Cable Company, Marion, Indiana
Volume :
94
Issue :
3
fYear :
1975
fDate :
5/1/1975 12:00:00 AM
Firstpage :
959
Lastpage :
966
Abstract :
A major challenge in the design and application of single conductor shielded power cable is to minimize losses in the insulation shield and at the same time provide adequate fault current capability for the shield. This paper discusses a test program and the results obtained in the investigation of fault current in the shield and fault current capability of the shield of a new cable design (embedded copper wire shield) as compared to an existing cable design (copper tape shield). The methods used should be of interest to cable producers and users in the investigation of other cable shield designs.
Keywords :
Cable insulation; Circuit faults; Circuit testing; Conductors; Copper; Electrostatics; Fault currents; Foot; Power cables; Wire;
fLanguage :
English
Journal_Title :
Power Apparatus and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9510
Type :
jour
DOI :
10.1109/T-PAS.1975.31929
Filename :
1601531
Link To Document :
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