DocumentCode :
848504
Title :
Validity of I2T extrapolation of damaging fault currents in metering devices
Author :
Milligan, J.W.
Author_Institution :
Duncan Electric Company, Inc., Lafayette, Indiana
Volume :
94
Issue :
3
fYear :
1975
fDate :
5/1/1975 12:00:00 AM
Firstpage :
977
Lastpage :
982
Abstract :
The use of I2T to extrapolate data points of watthour meter destructive failure tests over a wide range of fault durations is questioned. Data from an experiment using special test fixtures designed for ease of calculation of the electromechanical forces associated with fault currents is discussed for faults to failure having different current magnitudes and durations. High-current-short-duration faults required significantly lower I2T levels to produce a given failure mode than did low-current-long-duration faults. Several failure modes are defined. Confirming tests were made with modern single-phase watt-hour meters.
Keywords :
Circuit faults; Extrapolation; Fault currents; Fuses; Impedance; Sockets; Testing; Transformers; Watthour meters; Wire;
fLanguage :
English
Journal_Title :
Power Apparatus and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9510
Type :
jour
DOI :
10.1109/T-PAS.1975.31931
Filename :
1601533
Link To Document :
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