• DocumentCode
    84856
  • Title

    Corrections to “Super Fast Physics-Based Methodology for Accurate Memory Yield Prediction” [Mar 15 534-543]

  • Author

    Joshi, Rajiv V. ; Kanj, Rouwaida

  • Author_Institution
    , IBM T. J. Watson Laboratories, Yorktown Heights, NY, USA
  • Volume
    23
  • Issue
    7
  • fYear
    2015
  • fDate
    Jul-15
  • Firstpage
    1380
  • Lastpage
    1380
  • Abstract
    On [1, p. 536], Section II-A, second paragraph, lines 5–8, [2] should be used instead of [1] and the correct statement is as follows. “Model-to-hardware corroboration shows an excellent matching between importance-sampling-based methods yield estimation [2] and the true hardware yield. We therefore adopt the methodology in [2] as the core statistical engine for our TfM methodology.”
  • Keywords
    Capacitance; FinFETs; Mixed analog digital integrated circuits; SRAM chips; Statistical analysis; Yield estimation;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2015.2429293
  • Filename
    7115956