Title :
Robust Sequential Data Modeling Using an Outlier Tolerant Hidden Markov Model
Author :
Chatzis, Sotirios P. ; Kosmopoulos, Dimitrios I. ; Varvarigou, Theodora A.
Author_Institution :
Center for Comput. Sci., Univ. of Miami, Coral Gables, FL, USA
Abstract :
Hidden Markov (chain) models using finite Gaussian mixture models as their hidden state distributions have been successfully applied in sequential data modeling and classification applications. Nevertheless, Gaussian mixture models are well known to be highly intolerant to the presence of untypical data within the fitting data sets used for their estimation. Finite Student´s t-mixture models have recently emerged as a heavier-tailed, robust alternative to Gaussian mixture models, overcoming these hurdles. To exploit these merits of Student´s t-mixture models in the context of a sequential data modeling setting, we introduce, in this paper, a novel hidden Markov model where the hidden state distributions are considered to be finite mixtures of multivariate Student´s t-densities. We derive an algorithm for the model parameters estimation under a maximum likelihood framework, assuming full, diagonal, and factor-analyzed covariance matrices. The advantages of the proposed model over conventional approaches are experimentally demonstrated through a series of sequential data modeling applications.
Keywords :
Gaussian processes; data models; hidden Markov models; matrix algebra; maximum likelihood estimation; pattern classification; Gaussian mixture model; factor-analyzed covariance matrix; hidden Markov chain model; hidden state distribution; maximum likelihood framework; parameters estimation; robust sequential data modeling; student t-mixture model; Face and gesture recognition; Hidden Markov models; Machine learning; Markov processes; Multivariate statistics; Signal processing; Statistical; expectation-maximization; factor analysis; sequential data modeling.; student´s t-distribution; Algorithms; Artificial Intelligence; Computer Simulation; Information Storage and Retrieval; Markov Chains; Models, Statistical; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2008.215