Title :
Determining the injection efficiency of metal-semiconductor contacts
Author :
Lindmayer, J. ; Wrigley, C.
Author_Institution :
Sprague Electric Co., North Adams, Mass.
Keywords :
Admittance measurement; Capacitance measurement; Charge carrier lifetime; Charge carrier processes; Conductors; Crystals; Current measurement; Electron devices; Semiconductor diodes;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1963.1737
