• DocumentCode
    848689
  • Title

    Noise analysis of the quantum flux parametron

  • Author

    Ko, H.L. ; Lee, G.S.

  • Author_Institution
    Hewlett Packard Lab., Palo Alto, CA, USA
  • Volume
    2
  • Issue
    3
  • fYear
    1992
  • Firstpage
    156
  • Lastpage
    164
  • Abstract
    An analysis of the limitations imposed by thermal noise on the application of the quantum flux parametrons (QFPs) as current comparators and timing discriminators is presented. At low operational frequencies, a thermal activation approach is used, while at high frequencies a circuit simulation method is required. At frequencies greater than the Josephson junction plasma frequency, an approximate expression for the noise is given. The calculations are in good agreement with the approximations and the experimental results.<>
  • Keywords
    comparators (circuits); discriminators; electron device noise; microwave parametric oscillators; superconducting junction devices; superconducting microwave devices; thermal noise; Josephson junction plasma frequency; circuit simulation method; current comparators; low operational frequencies; quantum flux parametron; thermal activation approach; thermal noise; Application software; Circuit noise; Circuit simulation; Delay effects; Electronics packaging; Frequency; Hysteresis; Inductors; Quantum computing; Superconducting device noise;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.160155
  • Filename
    160155