Title :
Noise analysis of the quantum flux parametron
Author :
Ko, H.L. ; Lee, G.S.
Author_Institution :
Hewlett Packard Lab., Palo Alto, CA, USA
Abstract :
An analysis of the limitations imposed by thermal noise on the application of the quantum flux parametrons (QFPs) as current comparators and timing discriminators is presented. At low operational frequencies, a thermal activation approach is used, while at high frequencies a circuit simulation method is required. At frequencies greater than the Josephson junction plasma frequency, an approximate expression for the noise is given. The calculations are in good agreement with the approximations and the experimental results.<>
Keywords :
comparators (circuits); discriminators; electron device noise; microwave parametric oscillators; superconducting junction devices; superconducting microwave devices; thermal noise; Josephson junction plasma frequency; circuit simulation method; current comparators; low operational frequencies; quantum flux parametron; thermal activation approach; thermal noise; Application software; Circuit noise; Circuit simulation; Delay effects; Electronics packaging; Frequency; Hysteresis; Inductors; Quantum computing; Superconducting device noise;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
