DocumentCode :
849480
Title :
Experiments and modeling of conduction and charge accumulation in liquid crystal cells
Author :
Verschueren, A.R.M. ; Niessen, R.A.H. ; Notten, P.H.L. ; Oepts, W. ; Alexander-Moonen, E.M.L.
Author_Institution :
Philips Res. Labs., Eindhoven, Netherlands
Volume :
10
Issue :
6
fYear :
2003
Firstpage :
963
Lastpage :
969
Abstract :
A combination of different electrical measurement techniques is applied to liquid crystal (display) cells; voltage drop, current-voltage, dc stress measurements and impedance spectroscopy. It is found that at small timescale (seconds) conduction is dominated by transport of mobile ions, but at long timescale (hours) by (bulk) generation of extremely low mobility ions. These slow ions accumulate at ionic double layers at the liquid crystal-polyimid interface, giving rise to electric fields over the polyimid alignment layers. These processes of charge transport and accumulation are represented in consistent and insightful electrical network models.
Keywords :
charge measurement; electric potential; ionic conductivity; liquid crystal displays; surface charging; charge accumulation; conduction; current-voltage; dc stress measurements; electrical measurement techniques; extremely low mobility ions; impedance spectroscopy; liquid crystal cells; liquid crystal display cells; liquid crystal-polyimid interface; voltage drop; Current measurement; Electrochemical impedance spectroscopy; Impedance measurement; Indium tin oxide; Laboratories; Liquid crystal displays; Liquid crystals; Measurement techniques; Stress measurement; Voltage measurement;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2003.1255773
Filename :
1255773
Link To Document :
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